Investigation of ternary nitride semiconductor alloys by scanning tunneling microscopy
- Alternative title
-
Untersuchung von ternären Nitrid-Halbleiter-Legierungen mittels Rastertunnelmikroskopie
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
Jülich : Forschungszentrum Jülich GmbH, Zentralbibliothek, 2017
RWTH Aachen University, Dissertation, 2017
- Bibliographic citation
-
Schriften des Forschungszentrums Jülich. Reihe Information ; 48
- Classification
-
Physik
- Event
-
Veröffentlichung
- (where)
-
Aachen
- (who)
-
Universitätsbibliothek der RWTH Aachen
- (when)
-
2017
- Creator
- Contributor
-
Ebert, Philipp
Taubner, Thomas Günter
- DOI
-
10.18154/RWTH-2017-04262
- URN
-
urn:nbn:de:101:1-201805082039
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:50 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Portz, Verena
- Ebert, Philipp
- Taubner, Thomas Günter
- Universitätsbibliothek der RWTH Aachen
Time of origin
- 2017
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Investigation of ternary nitride semiconductor alloys by scanning tunneling microscopy
Scanning tunneling microscope study of the superconductor-insulator transition in molybdenum nitride
Quantitative scanning tunneling spectroscopy of non-polar III-V compound semiconductor surfaces
Scanning tunneling microscopy and photoelectron tunneling on cesium
Development of a charge sensor in III-V semiconductor nanowires for scanning tunneling microscopy
Spin-polarized scanning tunneling microscopy
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Nitrogen containing III-V semiconductor surfaces and nanostructures studied by scanning tunneling microscopy and spectroscopy
Nitride semiconductor devices : fundamentals and applications
Nitride semiconductor devices : principles and simulation