ASi-Sii defect model of light-induced degradation (LID) in silicon: a discussion and review
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource, 10 Seiten
- Language
-
Englisch
- Bibliographic citation
-
In: Physica status solidi(219), H. 19 - ISSN 1521-396X
In: Wiley-VCH, Weinheim
- Event
-
Veröffentlichung
- (where)
-
Ilmenau
- (who)
-
TU Ilmenau
- (when)
-
2022
- Creator
- DOI
-
10.1002/pssa.202200099
- URN
-
urn:nbn:de:101:1-2022120502062895620400
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:33 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
Time of origin
- 2022
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