Detailed investigation of surface passivation methods for lifetime measurements on silicon wafers
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: IEEE Journal of Photovoltaics ; 2 (2012), 1. - S. 1-6. - ISSN 2156-3381
- Klassifikation
-
Physik
- Ereignis
-
Veröffentlichung
- (wo)
-
Konstanz
- (wer)
-
Bibliothek der Universität Konstanz
- (wann)
-
2012
- Urheber
-
Pollock, Kevin L.
Junge, Johannes
Hahn, Giso
- URN
-
urn:nbn:de:bsz:352-185005
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:54 MEZ
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Beteiligte
- Pollock, Kevin L.
- Junge, Johannes
- Hahn, Giso
- Bibliothek der Universität Konstanz
Entstanden
- 2012
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