Minority charge carrier lifetime mapping of crystalline silicon wafers by time-resolved photoluminescence imaging
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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In: Melville, NY : American Institute of Physics
In: Journal of Applied Physics ; 110 (2011), 5. - 054508. - ISSN 0021-8979
- Classification
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Physik
- Event
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Veröffentlichung
- (where)
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Konstanz
- (who)
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Bibliothek der Universität Konstanz
- (when)
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2011
- Creator
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Kiliani, David
Micard, Gabriel
Steuer, Benjamin
Raabe, Bernd
Herguth, Axel
Hahn, Giso
- URN
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urn:nbn:de:bsz:352-161357
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:58 AM CEST
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Kiliani, David
- Micard, Gabriel
- Steuer, Benjamin
- Raabe, Bernd
- Herguth, Axel
- Hahn, Giso
- Bibliothek der Universität Konstanz
Time of origin
- 2011
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