Minority charge carrier lifetime mapping of crystalline silicon wafers by time-resolved photoluminescence imaging
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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In: Melville, NY : American Institute of Physics
In: Journal of Applied Physics ; 110 (2011), 5. - 054508. - ISSN 0021-8979
- Klassifikation
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Physik
- Ereignis
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Veröffentlichung
- (wo)
-
Konstanz
- (wer)
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Bibliothek der Universität Konstanz
- (wann)
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2011
- Urheber
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Kiliani, David
Micard, Gabriel
Steuer, Benjamin
Raabe, Bernd
Herguth, Axel
Hahn, Giso
- URN
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urn:nbn:de:bsz:352-161357
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:53 MEZ
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Beteiligte
- Kiliani, David
- Micard, Gabriel
- Steuer, Benjamin
- Raabe, Bernd
- Herguth, Axel
- Hahn, Giso
- Bibliothek der Universität Konstanz
Entstanden
- 2011
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