The Polarization Properties of the Reflection Spectra of Single-Layer MoS2 and ReS2 on SiO2/Si and Quartz Substrates
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1556-276X
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Anmerkungen
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online resource.
- Erschienen in
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The Polarization Properties of the Reflection Spectra of Single-Layer MoS2 and ReS2 on SiO2/Si and Quartz Substrates ; volume:15 ; number:1 ; day:17 ; month:2 ; year:2020 ; pages:1-6 ; date:12.2020
Nanoscale research letters ; 15, Heft 1 (17.2.2020), 1-6, 12.2020
- Urheber
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Shi, Yafang
Wang, Longlong
Qiao, Xiaofen
Li, Shuai
Liu, Yi
Li, Xiaoli
Zhao, Xiaohui
- Beteiligte Personen und Organisationen
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SpringerLink (Online service)
- DOI
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10.1186/s11671-020-3280-8
- URN
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urn:nbn:de:101:1-2020051403131449936570
- Rechteinformation
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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14.08.2025, 10:56 MESZ
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Beteiligte
- Shi, Yafang
- Wang, Longlong
- Qiao, Xiaofen
- Li, Shuai
- Liu, Yi
- Li, Xiaoli
- Zhao, Xiaohui
- SpringerLink (Online service)
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