- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: 10.1021/acsnano.1c06980
- Event
-
Veröffentlichung
- (where)
-
Aachen
- (who)
-
Universitätsbibliothek der RWTH Aachen
- (when)
-
2021
- Creator
-
Lanza, Mario
Waser, Rainer
Ielmini, Daniele
Yang, J. Joshua
Goux, Ludovic
Suñe, Jordi
Kenyon, Anthony Joseph
Mehonic, Adnan
Spiga, Sabina
Rana, Vikas
Wiefels, Stefan
Menzel, Stephan
Valov, Ilia
Villena, Marco A.
Miranda, Enrique
Jing, Xu
Campabadal, Francesca
Gonzalez, Mireia B.
Aguirre, Fernando
Palumbo, Felix
Zhu, Kaichen
Roldan, Juan Bautista
Puglisi, Francesco Maria
Larcher, Luca
Hou, Tuo-Hung
Prodromakis, Themis
Yang, Yuchao
Huang, Peng
Wan, Tianqing
Chai, Yang
Pey, Kin Leong
Raghavan, Nagarajan
Dueñas, Salvador
Wang, Tao
Xia, Qiangfei
Pazos, Sebastian
- DOI
-
10.18154/RWTH-2022-01934
- URN
-
urn:nbn:de:101:1-2022022403372749863698
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:47 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Lanza, Mario
- Waser, Rainer
- Ielmini, Daniele
- Yang, J. Joshua
- Goux, Ludovic
- Suñe, Jordi
- Kenyon, Anthony Joseph
- Mehonic, Adnan
- Spiga, Sabina
- Rana, Vikas
- Wiefels, Stefan
- Menzel, Stephan
- Valov, Ilia
- Villena, Marco A.
- Miranda, Enrique
- Jing, Xu
- Campabadal, Francesca
- Gonzalez, Mireia B.
- Aguirre, Fernando
- Palumbo, Felix
- Zhu, Kaichen
- Roldan, Juan Bautista
- Puglisi, Francesco Maria
- Larcher, Luca
- Hou, Tuo-Hung
- Prodromakis, Themis
- Yang, Yuchao
- Huang, Peng
- Wan, Tianqing
- Chai, Yang
- Pey, Kin Leong
- Raghavan, Nagarajan
- Dueñas, Salvador
- Wang, Tao
- Xia, Qiangfei
- Pazos, Sebastian
- Universitätsbibliothek der RWTH Aachen
Time of origin
- 2021
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Transient processes in resistive switching memory devices at ultimate time scale down to sub-nanosecond range
Defect interactions and diffusion in resistive switching oxides
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