Hochschulschrift

Quantitative in-situ particle characterization using focused beam reflectance measurements

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Location: Deutsche Nationalbibliothek Frankfurt am Main

ISBN: 9783183898039

Dimensions: 21 cm

Extent: XXII, 187 S.

Edition: Als Ms. gedr.

Language: Englisch

Notes: Ill., graph. Darst.
Zugl.: Aachen, Techn. Hochsch., Diss.

Bibliographic citation: Fortschrittberichte VDI / 3 / Verein Deutscher Ingenieure ; Nr. 898, Reihe 3

Keyword: Teilchenmesstechnik
Reflektometrie
Laserstrahlung
Fokussierung
Korngrößenanalyse
Online-Messung
Messung
Testen

Event: Veröffentlichung

(where): Düsseldorf

(who): VDI-Verl.

(when): 2009

Creator: Kail, Norbert

Table of contents: https://d-nb.info/993097561/04

Rights: Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.

Last update: 11.06.2025, 1:41 PM CEST

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Hochschulschrift

Associated

Kail, Norbert
VDI-Verl.

Time of origin

2009

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Quantitative in-situ particle characterization using focused beam reflectance measurements

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Other Objects (12)

Focused particle beam-induced processing

Focused particle beam-induced processing

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Monolithic focused reference beam x-ray holography

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