Hochschulschrift
Quantitative in-situ particle characterization using focused beam reflectance measurements
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783183898039
- Maße
-
21 cm
- Umfang
-
XXII, 187 S.
- Ausgabe
-
Als Ms. gedr.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Zugl.: Aachen, Techn. Hochsch., Diss.
- Erschienen in
-
Fortschrittberichte VDI / 3 / Verein Deutscher Ingenieure ; Nr. 898, Reihe 3
- Schlagwort
-
Teilchenmesstechnik
Reflektometrie
Laserstrahlung
Fokussierung
Korngrößenanalyse
Online-Messung
Messung
Testen
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:41 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Hochschulschrift
Beteiligte
- Kail, Norbert
- VDI-Verl.
Entstanden
- 2009
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