Hochschulschrift
Advanced focused ion beam: preparation optimization and damage mitigation
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Maße
-
31 cm
- Umfang
-
XVI, 115 Seiten
- Sprache
-
Englisch
- Anmerkungen
-
Illustrationen
Technische Universität Dresden, Dissertation, 2018
- Klassifikation
-
Elektrotechnik, Elektronik
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 14:06 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Hochschulschrift
Beteiligte
Entstanden
- [2018]
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