Impact of Hierarchical Dopant‐Induced Microstructure on Thermoelectric Properties of p‐Type Si‐Ge Alloys Revealed by Comprehensive Multi‐Scale Characterization

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Impact of Hierarchical Dopant‐Induced Microstructure on Thermoelectric Properties of p‐Type Si‐Ge Alloys Revealed by Comprehensive Multi‐Scale Characterization ; day:25 ; month:04 ; year:2024 ; extent:15
Advanced functional materials ; (25.04.2024) (gesamt 15)

Creator
Jang, Kyuseon
Ko, Won‐Seok
Son, Ji‐Hee
Jang, Jeong‐In
Kim, Bongseo
Vega‐Parades, Miquel
Jang, Hanhwi
Allahyari, Maryam
Kim, Se‐Ho
Ryou, KenHee
Chae, Donghyeon
Park, Hail
Jung, Yeon Sik
Oh, Min‐Wook
Jung, Chanwon
Scheu, Christina
Choi, Pyuck‐Pa

DOI
10.1002/adfm.202403785
URN
urn:nbn:de:101:1-2404261403336.756607288346
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 11:04 AM CEST

Data provider

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Associated

  • Jang, Kyuseon
  • Ko, Won‐Seok
  • Son, Ji‐Hee
  • Jang, Jeong‐In
  • Kim, Bongseo
  • Vega‐Parades, Miquel
  • Jang, Hanhwi
  • Allahyari, Maryam
  • Kim, Se‐Ho
  • Ryou, KenHee
  • Chae, Donghyeon
  • Park, Hail
  • Jung, Yeon Sik
  • Oh, Min‐Wook
  • Jung, Chanwon
  • Scheu, Christina
  • Choi, Pyuck‐Pa

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