Impact of Hierarchical Dopant‐Induced Microstructure on Thermoelectric Properties of p‐Type Si‐Ge Alloys Revealed by Comprehensive Multi‐Scale Characterization
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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Impact of Hierarchical Dopant‐Induced Microstructure on Thermoelectric Properties of p‐Type Si‐Ge Alloys Revealed by Comprehensive Multi‐Scale Characterization ; day:25 ; month:04 ; year:2024 ; extent:15
Advanced functional materials ; (25.04.2024) (gesamt 15)
- Creator
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Jang, Kyuseon
Ko, Won‐Seok
Son, Ji‐Hee
Jang, Jeong‐In
Kim, Bongseo
Vega‐Parades, Miquel
Jang, Hanhwi
Allahyari, Maryam
Kim, Se‐Ho
Ryou, KenHee
Chae, Donghyeon
Park, Hail
Jung, Yeon Sik
Oh, Min‐Wook
Jung, Chanwon
Scheu, Christina
Choi, Pyuck‐Pa
- DOI
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10.1002/adfm.202403785
- URN
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urn:nbn:de:101:1-2404261403336.756607288346
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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14.08.2025, 11:04 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Jang, Kyuseon
- Ko, Won‐Seok
- Son, Ji‐Hee
- Jang, Jeong‐In
- Kim, Bongseo
- Vega‐Parades, Miquel
- Jang, Hanhwi
- Allahyari, Maryam
- Kim, Se‐Ho
- Ryou, KenHee
- Chae, Donghyeon
- Park, Hail
- Jung, Yeon Sik
- Oh, Min‐Wook
- Jung, Chanwon
- Scheu, Christina
- Choi, Pyuck‐Pa