Christina Scheu
Geboren:
1965
Hat mitgewirkt an:
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Impact of Hierarchical Dopant‐Induced Microstructure on Thermoelectric Properties of p‐Type Si‐Ge Alloys Revealed by Comprehensive Multi‐Scale Characterization
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Analytische Untersuchungen an Cu-Al2O3- und Cu-Ti-Al2O3-Grenzflächen
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Spontaneous fluctuations in a plasma ion assisted deposition : correlation between deposition conditions and vanadium oxide thin film growth
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Correlation of microstructures and thermal conductivity of the thermoelectric material \(Ag_16.7}SB_{30}Te_{53.3}\)