Jonas Bartsch
Chemiker
Hat mitgewirkt an:
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Atomic Force Microscopy Analysis of Aluminum Layer Properties and Correlation to Masking Functionality in Copper Plating Metallization for Solar Cells
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Improved uniformity and anisotropy of through-mask electrochemical micromachining by localized etching and homogeneous flow
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Reaction Mechanisms of High‐Rate Copper Electrochemical Machining in Nitrate Electrolytes
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Reaction Mechanisms of High‐Rate Copper Electrochemical Machining in Nitrate Electrolytes