Process development and electrical characterization of CMOS-integrated memristive devices for emerging non-volatile memory applications
- Weitere Titel
-
Prozessentwicklung und elektrische Charakterisierung von CMOS-integrierten memristiven Bauelementen für neuartige nichtflüchtige Speicheranwendungen
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
Cottbus, BTU Cottbus - Senftenberg, Dissertation, 2023
- Klassifikation
-
Elektrotechnik, Elektronik
- Schlagwort
-
CMOS
Memristor
Nichtflüchtiger Speicher
Elektronik
Neuroinformatik
RAM
CMOS
Nichtflüchtiger Speicher
Memristor
Modellierung
Dispersion
- Ereignis
-
Veröffentlichung
- (wo)
-
Cottbus
- (wer)
-
BTU Cottbus - Senftenberg
- (wann)
-
2023
- Urheber
-
Kalishettyhalli Mahadevaiah, Mamathamba
- Beteiligte Personen und Organisationen
- DOI
-
10.26127/BTUOpen-6557
- URN
-
urn:nbn:de:kobv:co1-opus4-65571
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:53 MEZ
Datenpartner
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Beteiligte
- Kalishettyhalli Mahadevaiah, Mamathamba
- Wenger, Christian
- Mai, Andreas
- Ziegler, Martin
- BTU Cottbus - Senftenberg
Entstanden
- 2023
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