Process development and electrical characterization of CMOS-integrated memristive devices for emerging non-volatile memory applications

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Alternative title: Prozessentwicklung und elektrische Charakterisierung von CMOS-integrierten memristiven Bauelementen für neuartige nichtflüchtige Speicheranwendungen

Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Notes: Cottbus, BTU Cottbus - Senftenberg, Dissertation, 2023

Classification: Elektrotechnik, Elektronik

Keyword: CMOS
Memristor
Nichtflüchtiger Speicher
Elektronik
Neuroinformatik
RAM
CMOS
Nichtflüchtiger Speicher
Memristor
Modellierung
Dispersion

Event: Veröffentlichung

(where): Cottbus

(who): BTU Cottbus - Senftenberg

(when): 2023

Creator: Kalishettyhalli Mahadevaiah, Mamathamba

Contributor: Wenger, Christian
Mai, Andreas
Ziegler, Martin

DOI: 10.26127/BTUOpen-6557

URN: urn:nbn:de:kobv:co1-opus4-65571

Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 25.03.2025, 1:53 PM CET

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Associated

Kalishettyhalli Mahadevaiah, Mamathamba
Wenger, Christian
Mai, Andreas
Ziegler, Martin
BTU Cottbus - Senftenberg

Time of origin

2023

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Process development and electrical characterization of CMOS-integrated memristive devices for emerging non-volatile memory applications

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Other Objects (12)

Analogue pattern recognition with stochastic switching binary CMOS-integrated memristive devices.

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Tailored electrical characteristics in multilayer metal-oxide-based-memristive devices

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Memristive devices for metrological applications

Memristive Devices For Neuronal Systems

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Tailored electrical characteristics in multilayer metal-oxide-based-memristive devices

In-depth electrical characterization of HfO₂-based memristive devices for their integration in CMOS-compatible neuromorphic systems

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Transmission Electron Microscopy on Memristive Devices

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Analogue pattern recognition with stochastic switching binary CMOS-integrated memristive devices.

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