Thickness‐Related Analog Switching in SiO x/Cu/SiO x Memristive Devices for Neuromorphic Applications

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Thickness‐Related Analog Switching in SiO x/Cu/SiO x Memristive Devices for Neuromorphic Applications ; day:18 ; month:12 ; year:2024 ; extent:10
Advanced engineering materials ; (18.12.2024) (gesamt 10)

Creator
Lamprecht, Rouven
Vialetto, Luca
Gergs, Tobias
Zahari, Finn
Marquardt, Richard
Kohlstedt, Hermann
Trieschmann, Jan

DOI
10.1002/adem.202401824
URN
urn:nbn:de:101:1-2412191318365.876585022521
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:20 AM CEST

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