Aufsatzsammlung
Conductive atomic force microscopy : applications in nanomaterials
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783527340910
3527340912
- Maße
-
25 cm
- Umfang
-
XIX, 361 Seiten
- Ausgabe
-
[1. Auflage]
- Sprache
-
Englisch
- Anmerkungen
-
Illustrationen, Diagramme
- Schlagwort
-
Elektrische Leitfähigkeit
Rasterkraftmikroskopie
- Ereignis
-
Veröffentlichung
- (wo)
-
Weinheim, Germany
- (wer)
-
Wiley-VCH
- (wann)
-
[2017]
- Beteiligte Personen und Organisationen
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.03.2025, 12:26 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Aufsatzsammlung
Beteiligte
- Lanza, Mario
- Wiley-VCH
- Wiley-VCH
Entstanden
- [2017]
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