- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
In: Proceedings / International Test Conference 1994. Piscataway, NJ : IEEE Service Center, 1994. - ISBN 0-7803-2102-2, S. 729-738. URL http://dx.doi.org./ 10.1109/TEST.1994.528019
- Klassifikation
-
Elektrotechnik, Elektronik
- Schlagwort
-
CMOS ; Fehlererkennung ; Prüfprogramm
- Ereignis
-
Veröffentlichung
- (wo)
-
Stuttgart
- (wer)
-
Universitätsbibliothek der Universität Stuttgart
- (wann)
-
2012
- Urheber
- URN
-
urn:nbn:de:bsz:93-opus-72944
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:26 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Stern, Olaf
- Wunderlich, Hans-Joachim
- Universitätsbibliothek der Universität Stuttgart
Entstanden
- 2012
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