Non-destructive spatially resolved characterization of porous silicon layer stacks
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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In: AIP Conference Proceedings. American Institute of Physics (AIP). 2023(2826), 120002. ISSN 0094-243X. eISSN 1551-7616. Available under: doi: 10.1063/5.0141239
- Ereignis
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Veröffentlichung
- (wo)
-
Konstanz
- (wer)
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KOPS Universität Konstanz
- (wann)
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2023
- Urheber
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Micard, Gabriel
Botchak, Yves Patrick
Terheiden, Barbara
- URN
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urn:nbn:de:bsz:352-2-16flwk18d7ifk7
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:56 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Micard, Gabriel
- Botchak, Yves Patrick
- Terheiden, Barbara
- KOPS Universität Konstanz
Entstanden
- 2023
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