Non-destructive spatially resolved characterization of porous silicon layer stacks
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: AIP Conference Proceedings. American Institute of Physics (AIP). 2023(2826), 120002. ISSN 0094-243X. eISSN 1551-7616. Available under: doi: 10.1063/5.0141239
- Event
-
Veröffentlichung
- (where)
-
Konstanz
- (who)
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KOPS Universität Konstanz
- (when)
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2023
- Creator
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Micard, Gabriel
Botchak, Yves Patrick
Terheiden, Barbara
- URN
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urn:nbn:de:bsz:352-2-16flwk18d7ifk7
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:44 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Micard, Gabriel
- Botchak, Yves Patrick
- Terheiden, Barbara
- KOPS Universität Konstanz
Time of origin
- 2023
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Entwicklung und Charakterisierung neuartiger Hochleistungssolarzellen
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