- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783896493064
389649306X
- Maße
-
21 cm
- Umfang
-
X, 137 S.
- Ausgabe
-
1. Aufl.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Zugl.: Zürich, Eidgenössische Techn. Hochsch., Diss., 1998
- Erschienen in
-
Series in microelectronics ; Vol. 74
- Schlagwort
-
CMOS
Zuverlässigkeit
Elektromigration
Metallisieren
Mikrostruktur
Oberflächenanalyse
- Ereignis
-
Veröffentlichung
- (wo)
-
Konstanz
- (wer)
-
Hartung-Gorre
- (wann)
-
1998
- Urheber
-
Schönbächler, Edgar Arthur
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.03.2025, 12:28 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Objekttyp
- Hochschulschrift
Beteiligte
- Schönbächler, Edgar Arthur
- Hartung-Gorre
Entstanden
- 1998
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