Hochschulschrift | Online-Publikation
Charge carrier dynamics and defect generation at the Si/SiO2 interface proped by femtosecond optical second harmonic generation
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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Jena, Univ., Diss., 2005
- Classification
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Physik
- Keyword
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Silicium
Siliciumdioxid
Grenzfläche
Ladungsträger
Frequenzumsetzung
Silicium-Siliciumdioxid-Grenzfläche ; Frequenzverdopplung
- Creator
- URN
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urn:nbn:de:gbv:27-dbt-004268-3
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:20 AM CEST
Data provider
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
- Online-Publikation
Associated
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Excited States Dynamics at Pentacene/Perfluoropentacene Interfaces: A Femtosecond Time‐Resolved Second Harmonic Generation Study
Charge carrier dynamics and defect generation at the Si/SiO2 interface probed by femtosecond optical second harmonic generation
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Frontiers of High-Harmonic Generation
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