Generation of Terahertz Radiation under the Femtosecond Laser Excitation of a Multilayer Structure Based on a-Si:H/a-SiC:H/c-Si
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
1090-6487
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
online resource.
- Bibliographic citation
-
Generation of Terahertz Radiation under the Femtosecond Laser Excitation of a Multilayer Structure Based on a-Si:H/a-SiC:H/c-Si ; volume:116 ; number:12 ; day:13 ; month:2 ; year:2023 ; pages:859-862 ; date:12.2022
JETP letters ; 116, Heft 12 (13.2.2023), 859-862, 12.2022
- Creator
-
Andrianov, A. V.
Aleshin, A. N.
Abolmasov, S. N.
Terukov, E. I.
Beregulin, E. V.
- Contributor
-
SpringerLink (Online service)
- DOI
-
10.1134/S0021364022602585
- URN
-
urn:nbn:de:101:1-2023041609223643258079
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:49 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Andrianov, A. V.
- Aleshin, A. N.
- Abolmasov, S. N.
- Terukov, E. I.
- Beregulin, E. V.
- SpringerLink (Online service)
Other Objects (12)
Tunable nonlinear optical properties in nanocrystalline Si/SiO2 multilayers under femtosecond excitation
Effect of SiO2 interlayer thickness in Au/SiO2/Si multilayer systems on Si sources and the formation of Au-based nanostructures
Cavatina: " Si.. Si.. Si.. Si.. Signor morto"
Effect of SiO 2 Interlayer Thickness in Au/SiO 2/Si Multilayer Systems on Si Sources and the Formation of Au‐Based Nanostructures
Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiO x -Si Multilayer
Prozessinduzierte Fehlergefüge in Siliziumeinkristallen : Systeme Si-SiOx, Si-SiO2 und Si-SiBx
Aria: Sì sì mi basta sì
Si* SiMONe
SiMONe Si
Analysis of thickness-dependent optical parameters of a-Si:H/nc-Si:H multilayer thin films
Si-Si-Synthesen über Si-Hg-Verbindungen
EPR-Defektzentren in Si-SiO2-Phasengrenzschichten [SiSiO-Phasengrenzschichten]
Tunable nonlinear optical properties in nanocrystalline Si/SiO2 multilayers under femtosecond excitation
Effect of SiO2 interlayer thickness in Au/SiO2/Si multilayer systems on Si sources and the formation of Au-based nanostructures
Cavatina: " Si.. Si.. Si.. Si.. Signor morto"
Effect of SiO 2 Interlayer Thickness in Au/SiO 2/Si Multilayer Systems on Si Sources and the Formation of Au‐Based Nanostructures
Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiO x -Si Multilayer
Prozessinduzierte Fehlergefüge in Siliziumeinkristallen : Systeme Si-SiOx, Si-SiO2 und Si-SiBx
Aria: Sì sì mi basta sì
Si* SiMONe
SiMONe Si
Analysis of thickness-dependent optical parameters of a-Si:H/nc-Si:H multilayer thin films
Si-Si-Synthesen über Si-Hg-Verbindungen
EPR-Defektzentren in Si-SiO2-Phasengrenzschichten [SiSiO-Phasengrenzschichten]
Tunable nonlinear optical properties in nanocrystalline Si/SiO2 multilayers under femtosecond excitation
Effect of SiO2 interlayer thickness in Au/SiO2/Si multilayer systems on Si sources and the formation of Au-based nanostructures
Cavatina: " Si.. Si.. Si.. Si.. Signor morto"
Effect of SiO 2 Interlayer Thickness in Au/SiO 2/Si Multilayer Systems on Si Sources and the Formation of Au‐Based Nanostructures
Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiO x -Si Multilayer
Prozessinduzierte Fehlergefüge in Siliziumeinkristallen : Systeme Si-SiOx, Si-SiO2 und Si-SiBx
Aria: Sì sì mi basta sì
Si* SiMONe
SiMONe Si
Analysis of thickness-dependent optical parameters of a-Si:H/nc-Si:H multilayer thin films
Si-Si-Synthesen über Si-Hg-Verbindungen