Hochschulschrift
Transmission electron microscopy of semiconductor nanostructures : an analysis of composition and strain state
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540004141
3540004149
- Maße
-
24 cm
- Umfang
-
XII, 238 S.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Zugl.: Karlsruhe, Univ., Habil.-Schr., 2001
- Erschienen in
-
Springer tracts in modern physics ; Vol. 182
- Schlagwort
-
Verbindungshalbleiter
Nanostruktur
Durchstrahlungselektronenmikroskopie
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin, Heidelberg, New York, Hong Kong, London, Milan, Paris, Tokyo
- (wer)
-
Springer
- (wann)
-
2003
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 14:03 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Objekttyp
- Hochschulschrift
Beteiligte
- Rosenauer, Andreas
- Springer
Entstanden
- 2003
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