Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations
- Alternative title
-
Quantitative Rastertransmissionselektronenmikroskopie für III-V Halbleiterheterostrukturen unter Verwendung von Bildsimulationen
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
-
Englisch
- Notes
-
Marburg, Philipps-Universität Marburg, Dissertation, 2019
- Keyword
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Heterostructures
- Event
-
Veröffentlichung
- (where)
-
Marburg
- (who)
-
Philipps-Universität Marburg
- (when)
-
2019
- Creator
-
Kükelhan, Pirmin
- Contributor
-
Volz, Kerstin
- URN
-
urn:nbn:de:hebis:04-z2019-04832
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:52 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Kükelhan, Pirmin
- Volz, Kerstin
- Philipps-Universität Marburg
Time of origin
- 2019
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