A metrological atomic force microscope system

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Bibliographic citation: In: Nano Express 2.1 (2021): 010035.

Event: Veröffentlichung

(where): Erlangen

(who): Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)

(when): 2021

Creator: Wu, Yiting
Wirthmann, Elisa
Klöpzig, Ute
Hausotte, Tino

DOI: 10.1088/2632-959X/abed5e

URN: urn:nbn:de:bvb:29-opus4-182809

Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 15.08.2025, 7:34 AM CEST

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Associated

Wu, Yiting
Wirthmann, Elisa
Klöpzig, Ute
Hausotte, Tino
Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)

Time of origin

2021

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A metrological atomic force microscope system

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Other Objects (12)

The atomic force microscope as a mechano–electrochemical pen

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

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Molecule graph reconstruction from atomic force microscope images with machine learning

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Nanomachining of mesoscopic electronic devices using an atomic force microscope

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Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy

Investigating local properties of living cells with the atomic force microscope

Molecule graph reconstruction from atomic force microscope images with machine learning

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Site-controlled quantum dots fabricated using an atomic-force microscope assisted technique

Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction

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