Investigating local properties of living cells with the atomic force microscope
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
In: Proceedings of the NATO Advanced Research Workshop: Scanning Probe Microscopies and Molecular Materials , 25.05.1994 - 03.06.1994, Schloss Ringberg, Tegernsee
- Klassifikation
-
Biowissenschaften, Biologie
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin
- (wer)
-
Humboldt-Universität zu Berlin
- (wann)
-
1994
- Urheber
-
Hoh, Jan H.
Schoenenberger, C.-A.
Müller, M. E.
- DOI
-
10.18452/988
- URN
-
urn:nbn:de:kobv:11-1004580urn:nbn:de:kobv:11-1004591
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:56 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Hoh, Jan H.
- Schoenenberger, C.-A.
- Müller, M. E.
- Humboldt-Universität zu Berlin
Entstanden
- 1994
Ähnliche Objekte (12)
Investigating bioconjugation by atomic force microscopy
Investigation of biological macromolecules using atomic force microscope-based techniques
Nanomachining of mesoscopic electronic devices using an atomic force microscope
Atomic Force Microscope (AFM) Cantilevers as Encoder for Real-Time Displacement Measurements
Imaging membrane proteins in their native environment with the atomic force microscope
Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction
Atomic force microscope (AFM) cantilevers as encoder for real-time displacement measurements
Controlled surface manipulation at the nanometer scale based on the atomic force microscope
Electrochemical nanopatterning of Si surfaces through insulating layers by atomic force microscope scratching
Development of a traceable atomic force microscope with interferometer and compensation flexure stage
Development of a traceable atomic force microscope with interferometer and compensation flexure stage
On the adhesion between fine particles and nanocontacts : an atomic force microscope study
Investigating bioconjugation by atomic force microscopy
Investigation of biological macromolecules using atomic force microscope-based techniques
Nanomachining of mesoscopic electronic devices using an atomic force microscope
Atomic Force Microscope (AFM) Cantilevers as Encoder for Real-Time Displacement Measurements
Imaging membrane proteins in their native environment with the atomic force microscope
Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction
Atomic force microscope (AFM) cantilevers as encoder for real-time displacement measurements
Controlled surface manipulation at the nanometer scale based on the atomic force microscope
Electrochemical nanopatterning of Si surfaces through insulating layers by atomic force microscope scratching
Development of a traceable atomic force microscope with interferometer and compensation flexure stage
Development of a traceable atomic force microscope with interferometer and compensation flexure stage
On the adhesion between fine particles and nanocontacts : an atomic force microscope study
Investigating bioconjugation by atomic force microscopy
Investigation of biological macromolecules using atomic force microscope-based techniques
Nanomachining of mesoscopic electronic devices using an atomic force microscope
Atomic Force Microscope (AFM) Cantilevers as Encoder for Real-Time Displacement Measurements
Imaging membrane proteins in their native environment with the atomic force microscope
Atomic force microscope based Kelvin probe measurements : application to an electrochemical reaction
Atomic force microscope (AFM) cantilevers as encoder for real-time displacement measurements
Controlled surface manipulation at the nanometer scale based on the atomic force microscope
Electrochemical nanopatterning of Si surfaces through insulating layers by atomic force microscope scratching
Development of a traceable atomic force microscope with interferometer and compensation flexure stage
Development of a traceable atomic force microscope with interferometer and compensation flexure stage