Nanomachining of mesoscopic electronic devices using an atomic force microscope
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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In: Schumacher, H.W.; Keyser, U.F.; Zeitler, U.; Haug, R.J.; Eberl, K.: Nanomachining of mesoscopic electronic devices using an atomic force microscope. In: Applied Physics Letters 75 (1999), Nr. 8, S. 1107-1109. DOI: https://doi.org/10.1063/1.124611
- Ereignis
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Veröffentlichung
- (wo)
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Hannover, Hannover
- (wer)
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Gottfried Wilhelm Leibniz Universität Hannover, Technische Informationsbibliothek (TIB)
- (wann)
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1999
- DOI
-
10.15488/2826
- URN
-
urn:nbn:de:101:1-2020061208380765209750
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:55 MEZ
Datenpartner
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Beteiligte
- Gottfried Wilhelm Leibniz Universität Hannover, Technische Informationsbibliothek (TIB)
Entstanden
- 1999
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