Fast in-situ tool inspection based on inverse fringe projection and compact sensor heads
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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In: Matthias, S.; Kästner, M.; Reithmeier, E.: Fast in-situ tool inspection based on inverse fringe projection and compact sensor heads. In: Proceedings of SPIE - The International Society for Optical Engineering 10023 (2016), 100230K. DOI: https://doi.org/10.1117/12.2247482
- Ereignis
-
Veröffentlichung
- (wo)
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Hannover, Hannover
- (wer)
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Gottfried Wilhelm Leibniz Universität Hannover, Technische Informationsbibliothek (TIB)
- (wann)
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2016
- DOI
-
10.15488/1760
- URN
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urn:nbn:de:101:1-2020062306562673181897
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:56 MEZ
Datenpartner
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Beteiligte
- Gottfried Wilhelm Leibniz Universität Hannover, Technische Informationsbibliothek (TIB)
Entstanden
- 2016
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