Automated defect recognition in X-ray projections using neural networks trained on simulated and real-world data
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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Automated defect recognition in X-ray projections using neural networks trained on simulated and real-world data ; volume:28 ; number:3 ; year:2023
E-Journal of nondestructive testing ; 28, Heft 3 (2023)
- Urheber
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Schön, Tobias
Gosswami, Bishwajit Mohan
Hvingelby, Rasmus
Suth, Daniel
Kemeter, Lukas Malte
Sierak, Paulina
- DOI
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10.58286/27732
- URN
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urn:nbn:de:101:1-2024041112492070254101
- Rechteinformation
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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14.08.2025, 10:49 MESZ
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Beteiligte
- Schön, Tobias
- Gosswami, Bishwajit Mohan
- Hvingelby, Rasmus
- Suth, Daniel
- Kemeter, Lukas Malte
- Sierak, Paulina
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