Automated defect recognition in X-ray projections using neural networks trained on simulated and real-world data

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Automated defect recognition in X-ray projections using neural networks trained on simulated and real-world data ; volume:28 ; number:3 ; year:2023
E-Journal of nondestructive testing ; 28, Heft 3 (2023)

Creator
Schön, Tobias
Gosswami, Bishwajit Mohan
Hvingelby, Rasmus
Suth, Daniel
Kemeter, Lukas Malte
Sierak, Paulina

DOI
10.58286/27732
URN
urn:nbn:de:101:1-2024041112492070254101
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:49 AM CEST

Data provider

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Associated

  • Schön, Tobias
  • Gosswami, Bishwajit Mohan
  • Hvingelby, Rasmus
  • Suth, Daniel
  • Kemeter, Lukas Malte
  • Sierak, Paulina

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