Reliability Modeling and Mitigation in Advanced Memory Technologies and Paradigms
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
Karlsruhe, Karlsruher Institut für Technologie (KIT), Dissertation, 2024
- Keyword
-
Zuverlässigkeit
CMOS
- Event
-
Veröffentlichung
- (where)
-
Karlsruhe
- (who)
-
KIT-Bibliothek
- (when)
-
2024
- Creator
-
Mayahinia, Mahta
- Contributor
-
Tahoori, Mehdi B.
Anghel, Lorena
- DOI
-
10.5445/IR/1000172703
- URN
-
urn:nbn:de:101:1-2407310459062.953192251146
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:49 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Mayahinia, Mahta
- Tahoori, Mehdi B.
- Anghel, Lorena
- KIT-Bibliothek
Time of origin
- 2024
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