Meta-QTL analysis and identification of candidate genes for multiple-traits associated with spot blotch resistance in bread wheat

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: 1 Online-Ressource.

Language: Englisch

Bibliographic citation: Meta-QTL analysis and identification of candidate genes for multiple-traits associated with spot blotch resistance in bread wheat ; volume:14 ; number:1 ; day:7 ; month:6 ; year:2024 ; pages:1-13 ; date:12.2024
Scientific reports ; 14, Heft 1 (7.6.2024), 1-13, 12.2024

Creator: Vasistha, Neeraj Kumar
Sharma, Vaishali
Singh, Sahadev
Kaur, Ramandeep
Kumar, Anuj
Ravat, Vikas Kumar
Kumar, Rahul
Gupta, Pushpendra K.

Contributor: SpringerLink (Online service)

DOI: 10.1038/s41598-024-63924-w

URN: urn:nbn:de:101:1-2408151233045.998333248667

Rights: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 14.08.2025, 10:51 AM CEST

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Vasistha, Neeraj Kumar
Sharma, Vaishali
Singh, Sahadev
Kaur, Ramandeep
Kumar, Anuj
Ravat, Vikas Kumar
Kumar, Rahul
Gupta, Pushpendra K.
SpringerLink (Online service)

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Meta-QTL analysis and identification of candidate genes for multiple-traits associated with spot blotch resistance in bread wheat

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Other Objects (12)

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QTL Mapping for Grain Yield Conditioned on Its Component Traits in Two Ril Populations of Bread Wheat

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