Improved conductivity-measurement of semiconductor epitaxial layers by means of the contactless microwave method

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Notes: In: Millimeter and Submillimeter Waves and Applications : proceedings of the International Conference on Millimeter and Submillimeter Waves and Applications, 10 - 14 January 1994, San Diego, California / Mohammed N. Afsar. - Bellingham u.a. : SPIE, 1994. - ISBN: 0-8194-1515-4. - (SPIE:2211) 649-658

Classification: Physik

Keyword: Millimeterwelle
Kongreß
San Diego
1994>

Event: Veröffentlichung

(where): Würzburg

(who): Universität Würzburg

(when): 2009

Contributor: Boege, P.
Schäfer, H.
Shanjia, Xu
Xinzhang, Wu
Einfeldt, S.
Becker, Charles R.
Hommel, D.
Geick, R.

URN: urn:nbn:de:bvb:20-opus-37763

Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 14.08.2025, 10:46 AM CEST

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Associated

Boege, P.
Schäfer, H.
Shanjia, Xu
Xinzhang, Wu
Einfeldt, S.
Becker, Charles R.
Hommel, D.
Geick, R.
Universität Würzburg

Time of origin

2009

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Characterization of parasitic effects in integrated semiconductor devices with contactless fault isolation techniques

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Improved conductivity-measurement of semiconductor epitaxial layers by means of the contactless microwave method

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Other Objects (12)

Contactless measurement of the conductivity of II-VI epitaxial layers by means of the partially filled waveguide method

Microwave semiconductor devices

Optical Characterization of epitaxial semiconductor layers

Epitaxial semiconductor nanostructure growth with templates

Contactless conductivity measurements on La2CuO4 at radio frequencies

Contactless monitoring of the diameter-dependent conductivity of GaAs nanowires

Microwave conductivity investigations in plastically deformed silicon

Microwave and millimeter-wave interferometers for contactless characterization of dielectric biomedical samples

Microwave semiconductor devices : theory, technology and performance

Development of a contactless conductivity sensor in flowing micro systems for cerium nitrate

In–situ strain control in epitaxial silicon carbide compound semiconductor

Characterization of parasitic effects in integrated semiconductor devices with contactless fault isolation techniques

Contactless measurement of the conductivity of II-VI epitaxial layers by means of the partially filled waveguide method

Microwave semiconductor devices

Optical Characterization of epitaxial semiconductor layers

Epitaxial semiconductor nanostructure growth with templates

Contactless conductivity measurements on La2CuO4 at radio frequencies

Contactless monitoring of the diameter-dependent conductivity of GaAs nanowires

Microwave conductivity investigations in plastically deformed silicon

Microwave and millimeter-wave interferometers for contactless characterization of dielectric biomedical samples

Microwave semiconductor devices : theory, technology and performance

Development of a contactless conductivity sensor in flowing micro systems for cerium nitrate

In–situ strain control in epitaxial silicon carbide compound semiconductor

Characterization of parasitic effects in integrated semiconductor devices with contactless fault isolation techniques

Contactless measurement of the conductivity of II-VI epitaxial layers by means of the partially filled waveguide method

Microwave semiconductor devices

Optical Characterization of epitaxial semiconductor layers

Epitaxial semiconductor nanostructure growth with templates

Contactless conductivity measurements on La2CuO4 at radio frequencies

Contactless monitoring of the diameter-dependent conductivity of GaAs nanowires

Microwave conductivity investigations in plastically deformed silicon

Microwave and millimeter-wave interferometers for contactless characterization of dielectric biomedical samples

Microwave semiconductor devices : theory, technology and performance

Development of a contactless conductivity sensor in flowing micro systems for cerium nitrate

In–situ strain control in epitaxial silicon carbide compound semiconductor

Characterization of parasitic effects in integrated semiconductor devices with contactless fault isolation techniques

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