Scanning Probe Microscopy of Halide Perovskite Solar Cells

Abstract: Scanning probe microscopy (SPM) has enabled significant new insights into the nanoscale and microscale properties of solar cell materials and underlying working principles of photovoltaic and optoelectronic technology. Various SPM modes, including atomic force microscopy, Kelvin probe force microscopy, conductive atomic force microscopy, piezoresponse force microscopy, and scanning near‐field optical microscopy, can be used for the investigation of electrical, optical and chemical properties of associated functional materials. A large body of work has improved the understanding of solar cell device processing and synthesis in close synergy with SPM investigations in recent years. This review provides an overview of SPM measurement capabilities and attainable insight with a focus on recently widely investigated halide perovskite materials.

Standort
Deutsche Nationalbibliothek Frankfurt am Main
Umfang
Online-Ressource
Sprache
Englisch

Erschienen in
Scanning Probe Microscopy of Halide Perovskite Solar Cells ; day:20 ; month:08 ; year:2024 ; extent:23
Advanced materials ; (20.08.2024) (gesamt 23)

Urheber
Lee, Minwoo
Wang, Lei
Zhang, Dawei
Li, Jiangyu
Kim, Jincheol
Yun, Jae Sung
Seidel, Jan

DOI
10.1002/adma.202407291
URN
urn:nbn:de:101:1-2408211430397.934907653745
Rechteinformation
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Letzte Aktualisierung
14.08.2025, 11:01 MESZ

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Beteiligte

  • Lee, Minwoo
  • Wang, Lei
  • Zhang, Dawei
  • Li, Jiangyu
  • Kim, Jincheol
  • Yun, Jae Sung
  • Seidel, Jan

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