- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: Beilstein Journal of Nanotechnology, 11, S. 1714-1727
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin
- (wer)
-
Bundesanstalt für Materialforschung und -prüfung (BAM)
- (wann)
-
2020
- Urheber
-
Friedrich, Sebastian
Cappella, Brunero
- DOI
-
10.3762/bjnano.11.154
- URN
-
urn:nbn:de:kobv:b43-515621
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:30 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Friedrich, Sebastian
- Cappella, Brunero
- Bundesanstalt für Materialforschung und -prüfung (BAM)
Entstanden
- 2020
Ähnliche Objekte (12)
Application of contact-resonance AFM methods to polymer samples
Cantilever signature of tip detachment during contact resonance AFM
Nanomechanics & nanorheology of polymer networks: an AFM study
Nanoscale rippling on polymer surfaces induced by AFM manipulation
Nanotribological surface characterization by frequency modulated torsional resonance mode AFM
A robust AFM-based method for locally measuring the elasticity of samples
From single molecules to designed polymer materials, a lesson by AFM
AFM Magdeburg
AFM and SPR on biological systems : applying atomic force microscopy (AFM) and surface plasmon resonance (SPR) to biologically important systems
NanoLocz: Image Analysis Platform for AFM, High‐Speed AFM, and Localization AFM
Friction and mechanical properties of AFM-scan-induced ripples in polymer films
Enhanced feedback performance in off-resonance AFM modes through pulse train sampling
Application of contact-resonance AFM methods to polymer samples
Cantilever signature of tip detachment during contact resonance AFM
Nanomechanics & nanorheology of polymer networks: an AFM study
Nanoscale rippling on polymer surfaces induced by AFM manipulation
Nanotribological surface characterization by frequency modulated torsional resonance mode AFM
A robust AFM-based method for locally measuring the elasticity of samples
From single molecules to designed polymer materials, a lesson by AFM
AFM Magdeburg
AFM and SPR on biological systems : applying atomic force microscopy (AFM) and surface plasmon resonance (SPR) to biologically important systems
NanoLocz: Image Analysis Platform for AFM, High‐Speed AFM, and Localization AFM
Friction and mechanical properties of AFM-scan-induced ripples in polymer films
Enhanced feedback performance in off-resonance AFM modes through pulse train sampling
Application of contact-resonance AFM methods to polymer samples
Cantilever signature of tip detachment during contact resonance AFM
Nanomechanics & nanorheology of polymer networks: an AFM study
Nanoscale rippling on polymer surfaces induced by AFM manipulation
Nanotribological surface characterization by frequency modulated torsional resonance mode AFM
A robust AFM-based method for locally measuring the elasticity of samples
From single molecules to designed polymer materials, a lesson by AFM
AFM Magdeburg
AFM and SPR on biological systems : applying atomic force microscopy (AFM) and surface plasmon resonance (SPR) to biologically important systems
NanoLocz: Image Analysis Platform for AFM, High‐Speed AFM, and Localization AFM
Friction and mechanical properties of AFM-scan-induced ripples in polymer films