Temporary Surface Passivation for Characterisation of Bulk Defects in Silicon: A Review
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
-
Englisch
- Bibliographic citation
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Temporary Surface Passivation for Characterisation of Bulk Defects in Silicon: A Review ; volume:11 ; number:11 ; year:2017 ; extent:18
Physica status solidi / Rapid research letters. Rapid research letters ; 11, Heft 11 (2017) (gesamt 18)
- Creator
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Grant, Nicholas E.
Murphy, John D.
- DOI
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10.1002/pssr.201700243
- URN
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urn:nbn:de:101:1-2022093008422658348671
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
- 15.08.2025, 7:30 AM CEST
Data provider
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Grant, Nicholas E.
- Murphy, John D.
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