Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
2045-2322
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
online resource.
- Erschienen in
-
Deep learning-based noise filtering toward millisecond order imaging by using scanning transmission electron microscopy ; volume:12 ; number:1 ; day:5 ; month:8 ; year:2022 ; pages:1-13 ; date:12.2022
Scientific reports ; 12, Heft 1 (5.8.2022), 1-13, 12.2022
- Urheber
-
Ihara, Shiro
Saito, Hikaru
Yoshinaga, Mizumo
Avala, Lavakumar
Murayama, Mitsuhiro
- Beteiligte Personen und Organisationen
-
SpringerLink (Online service)
- DOI
-
10.1038/s41598-022-17360-3
- URN
-
urn:nbn:de:101:1-2022121621101534057873
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:22 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Ihara, Shiro
- Saito, Hikaru
- Yoshinaga, Mizumo
- Avala, Lavakumar
- Murayama, Mitsuhiro
- SpringerLink (Online service)
Ähnliche Objekte (12)
Noncontact in vivo scanning laser microscopy od filtering blebs
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Noise filtering options for conically scanning Doppler lidar measurements with low pulse accumulation
Noise filtering options for conically scanning Doppler LiDAR measurements with low pulse accumulation
Energy filtering transmission electron microscopy
Crackling noise microscopy
Noise filtering for big data analytics
Acoustic scanning probe microscopy
Scanning microscopy : symposium proceedings
Scanning ion conductance microscopy
Scanning acoustic tunneling microscopy and scanning acoustic force microscopy studies of oscillating surfaces
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Noncontact in vivo scanning laser microscopy od filtering blebs
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Noise filtering options for conically scanning Doppler lidar measurements with low pulse accumulation
Noise filtering options for conically scanning Doppler LiDAR measurements with low pulse accumulation
Energy filtering transmission electron microscopy
Crackling noise microscopy
Noise filtering for big data analytics
Acoustic scanning probe microscopy
Scanning microscopy : symposium proceedings
Scanning ion conductance microscopy
Scanning acoustic tunneling microscopy and scanning acoustic force microscopy studies of oscillating surfaces
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Noncontact in vivo scanning laser microscopy od filtering blebs
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Noise filtering options for conically scanning Doppler lidar measurements with low pulse accumulation
Noise filtering options for conically scanning Doppler LiDAR measurements with low pulse accumulation
Energy filtering transmission electron microscopy
Crackling noise microscopy
Noise filtering for big data analytics
Acoustic scanning probe microscopy
Scanning microscopy : symposium proceedings
Scanning ion conductance microscopy
Scanning acoustic tunneling microscopy and scanning acoustic force microscopy studies of oscillating surfaces