Rapid thermal annealing for high-quality ITO thin films deposited by radio-frequency magnetron sputtering

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Rapid thermal annealing for high-quality ITO thin films deposited by radio-frequency magnetron sputtering ; volume:10 ; pages:1511-1522
Beilstein journal of nanotechnology ; 10, 1511-1522

Classification
Ingenieurwissenschaften und Maschinenbau

DOI
10.3762/bjnano.10.149
URN
urn:nbn:de:101:1-2020111914193003778013
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:26 AM CEST

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