Nanosecond time-resolved reflectivity determination of the melting of metals upon pulsed laser annealing
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: Optics Communications ; 174 (2000), 1-4. - S. 145-149
- Classification
-
Physik
- Event
-
Veröffentlichung
- (where)
-
Konstanz
- (who)
-
Bibliothek der Universität Konstanz
- (when)
-
2007
- Creator
- URN
-
urn:nbn:de:bsz:352-opus-28604
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:55 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Boneberg, Johannes
- Bischof, Jörg
- Leiderer, Paul
- Bibliothek der Universität Konstanz
Time of origin
- 2007
Other Objects (12)
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Measurements of the ns-laserpulse induced expansion of (111) silicon below and above the melting threshold on the nanosecond time scale
Time-resolved measurements of the response of a STM tip upon illumination with a nanosecond laser pulse
Behavior of thin metallic films upon melting with a ns-laser pulse
Optical and electrical properties of pulsed laser annealed thin Si films
Dynamik der Verfestigung von Halbleiterschichten nach ns-laser-annealing
On the interpretation of time-resolved surface reflectivity measurements during the laser annealing of Si thin films
Laser-annealing of thin semiconductor films
Optical reflectivity of si above the melting point
Nanostructuring of thin films by ns pulsed laser interference
Nanoparticle adhesion and removal studied by pulsed laser irradiation
Optical near-field imaging and nanostructuring by means of laser ablation
Direct laser interference patterning
Measurements of the ns-laserpulse induced expansion of (111) silicon below and above the melting threshold on the nanosecond time scale
Time-resolved measurements of the response of a STM tip upon illumination with a nanosecond laser pulse
Behavior of thin metallic films upon melting with a ns-laser pulse
Optical and electrical properties of pulsed laser annealed thin Si films
Dynamik der Verfestigung von Halbleiterschichten nach ns-laser-annealing
On the interpretation of time-resolved surface reflectivity measurements during the laser annealing of Si thin films
Laser-annealing of thin semiconductor films
Optical reflectivity of si above the melting point
Nanostructuring of thin films by ns pulsed laser interference
Nanoparticle adhesion and removal studied by pulsed laser irradiation
Optical near-field imaging and nanostructuring by means of laser ablation
Direct laser interference patterning
Measurements of the ns-laserpulse induced expansion of (111) silicon below and above the melting threshold on the nanosecond time scale
Time-resolved measurements of the response of a STM tip upon illumination with a nanosecond laser pulse
Behavior of thin metallic films upon melting with a ns-laser pulse