- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1543-186X
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
-
online resource.
- Bibliographic citation
-
Electrical and Optical Properties of Stacking Faults in 4H-SiC Devices ; volume:39 ; number:6 ; day:26 ; month:3 ; year:2010 ; pages:684-687 ; date:6.2010
Journal of electronic materials ; 39, Heft 6 (26.3.2010), 684-687, 6.2010
- Creator
-
Chen, Bin
Chen, Jun
Sekiguchi, Takashi
Ohyanagi, Takasumi
Matsuhata, Hirofumi
Kinoshita, Akimasa
Okumura, Hajime
- Contributor
-
SpringerLink (Online service)
- DOI
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10.1007/s11664-010-1168-6
- URN
-
urn:nbn:de:101:1-2022021317542495566995
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:20 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Chen, Bin
- Chen, Jun
- Sekiguchi, Takashi
- Ohyanagi, Takasumi
- Matsuhata, Hirofumi
- Kinoshita, Akimasa
- Okumura, Hajime
- SpringerLink (Online service)