3D Reconstruction of a High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning with High-Precision EBSD and Surface Profilometry

to related objects

Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: 1 Online-Ressource.

Language: Englisch

Bibliographic citation: 3D Reconstruction of a High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning with High-Precision EBSD and Surface Profilometry ; volume:13 ; number:3 ; day:24 ; month:7 ; year:2024 ; pages:773-803 ; date:9.2024
Integrating materials and manufacturing innovation ; 13, Heft 3 (24.7.2024), 773-803, 9.2024

Classification: Geowissenschaften

Creator: Sparks, Gregory
Mason, Simon A.
Chapman, Michael G.
Park, Jun-Sang
Sharma, Hemant
Kenesei, Peter
Niezgoda, Stephen R.
Mills, Michael J.
Uchic, Michael D.
Shade, Paul A.
Obstalecki, Mark

Contributor: SpringerLink (Online service)

DOI: 10.1007/s40192-024-00370-6

URN: urn:nbn:de:101:1-2411261047499.315727627344

Rights: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 15.08.2025, 7:29 AM CEST

Data provider

This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.

Show original at data provider

Associated

Sparks, Gregory
Mason, Simon A.
Chapman, Michael G.
Park, Jun-Sang
Sharma, Hemant
Kenesei, Peter
Niezgoda, Stephen R.
Mills, Michael J.
Uchic, Michael D.
Shade, Paul A.
Obstalecki, Mark
SpringerLink (Online service)

Other Objects (12)

$Quantifying Dynamic Signal Spread in Real-Time High-Energy X-ray Diffraction$

Quantifying Dynamic Signal Spread in Real-Time High-Energy X-ray Diffraction

$AFRL Additive Manufacturing Modeling Series: Challenge 4, 3D Reconstruction of an IN625 High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning$

AFRL Additive Manufacturing Modeling Series: Challenge 4, 3D Reconstruction of an IN625 High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning

Bootstrapping high-energy observables

High-precision photometry with Ariel

$Reflection high-energy electron diffraction studies of semiconductor interfaces during molecular beam epitaxy growth$

Hochschulschrift

Reflection high-energy electron diffraction studies of semiconductor interfaces during molecular beam epitaxy growth

Chemistry of High-Energy Materials

Chemistry of high-energy materials

Detection of High-Energy Particles

High-precision regressors for particle physics

$Quantifying Dynamic Signal Spread in Real-Time High-Energy X-ray Diffraction$

Quantifying Dynamic Signal Spread in Real-Time High-Energy X-ray Diffraction

$AFRL Additive Manufacturing Modeling Series: Challenge 4, 3D Reconstruction of an IN625 High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning$

AFRL Additive Manufacturing Modeling Series: Challenge 4, 3D Reconstruction of an IN625 High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning

Bootstrapping high-energy observables

High-precision photometry with Ariel

$Reflection high-energy electron diffraction studies of semiconductor interfaces during molecular beam epitaxy growth$

Hochschulschrift

Reflection high-energy electron diffraction studies of semiconductor interfaces during molecular beam epitaxy growth

Chemistry of High-Energy Materials

Chemistry of high-energy materials

Detection of High-Energy Particles

High-precision regressors for particle physics

$Quantifying Dynamic Signal Spread in Real-Time High-Energy X-ray Diffraction$

Quantifying Dynamic Signal Spread in Real-Time High-Energy X-ray Diffraction

$AFRL Additive Manufacturing Modeling Series: Challenge 4, 3D Reconstruction of an IN625 High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning$

AFRL Additive Manufacturing Modeling Series: Challenge 4, 3D Reconstruction of an IN625 High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning

Bootstrapping high-energy observables

High-precision photometry with Ariel

$Reflection high-energy electron diffraction studies of semiconductor interfaces during molecular beam epitaxy growth$

Hochschulschrift

Reflection high-energy electron diffraction studies of semiconductor interfaces during molecular beam epitaxy growth

Chemistry of High-Energy Materials

Chemistry of high-energy materials

Detection of High-Energy Particles

High-precision regressors for particle physics

Cultural heritage institutions wishing to register will find more information here.

Fields marked * need to be filled in.

Username*

Please enter your username

Email*

Please enter your email address

Please do not fill this field

First name

Last name

Password*

Please enter your password

Confirm password*

Please enter the same password

I have read the terms of use and the privacy policy for the collection of personal data and accept them. *

This field is required.

I would like to subscribe to the newsletter of the Deutsche Digitale Bibliothek. See newsletter subscription info.

Account created

Your "My DDB" account has been successfully created. Before you can log in to your account, you must click the confirmation link in the message we just sent to the email address you provided.

3D Reconstruction of a High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning with High-Precision EBSD and Surface Profilometry

Object Details

References and Relationships

Classification and Topics

Contributors, Places and Time

Further information

Data provider

Associated

Other Objects (12)

Quantifying Dynamic Signal Spread in Real-Time High-Energy X-ray Diffraction

AFRL Additive Manufacturing Modeling Series: Challenge 4, 3D Reconstruction of an IN625 High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning

Bootstrapping high-energy observables

High-precision photometry with Ariel

Reflection high-energy electron diffraction studies of semiconductor interfaces during molecular beam epitaxy growth

Chemistry of High-Energy Materials

Chemistry of high-energy materials

Chemistry of high-energy materials

Chemistry of high-energy materials

Chemistry of high-energy materials

Detection of High-Energy Particles

High-precision regressors for particle physics

Quantifying Dynamic Signal Spread in Real-Time High-Energy X-ray Diffraction

AFRL Additive Manufacturing Modeling Series: Challenge 4, 3D Reconstruction of an IN625 High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning

Bootstrapping high-energy observables

High-precision photometry with Ariel

Reflection high-energy electron diffraction studies of semiconductor interfaces during molecular beam epitaxy growth

Chemistry of High-Energy Materials

Chemistry of high-energy materials

Chemistry of high-energy materials

Chemistry of high-energy materials

Chemistry of high-energy materials

Detection of High-Energy Particles

High-precision regressors for particle physics

Quantifying Dynamic Signal Spread in Real-Time High-Energy X-ray Diffraction

AFRL Additive Manufacturing Modeling Series: Challenge 4, 3D Reconstruction of an IN625 High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning

Bootstrapping high-energy observables

High-precision photometry with Ariel

Reflection high-energy electron diffraction studies of semiconductor interfaces during molecular beam epitaxy growth

Chemistry of High-Energy Materials

Chemistry of high-energy materials

Chemistry of high-energy materials

Chemistry of high-energy materials

Chemistry of high-energy materials

Detection of High-Energy Particles

High-precision regressors for particle physics

Related objects

Reset password