Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783662452394
3662452391
- Dimensions
-
25 cm
- Extent
-
XV, 382 S.
- Language
-
Englisch
- Notes
-
Ill., graph. Darst.
Literaturangaben
- Keyword
-
Rastersondenmikroskopie
Rasterkraftmikroskopie
Rastertunnelmikroskopie
- Event
-
Veröffentlichung
- (where)
-
Heidelberg, New York, NY, Dordrecht, London, Berlin
- (who)
-
Springer
- (when)
-
2015
- Creator
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.03.2025, 12:18 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Voigtländer, Bert
- Springer
Time of origin
- 2015
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