Removing the orientational degeneracy of the TS defect in 4H–SiC by electric fields and strain

to related objects

Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Bibliographic citation: In: New Journal of Physics 23.7 (2021): 073002.

Event: Veröffentlichung

(where): Erlangen

(who): Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)

(when): 2021

Creator: Rühl, Maximilian
Lehmeyer, Johannes
Nagy, Roland
Weisser, Matthias
Bockstedte, Michel
Krieger, Michael
Weber, Heiko B.

DOI: 10.1088/1367-2630/abfb3e

URN: urn:nbn:de:bvb:29-opus4-184786

Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 15.08.2025, 7:25 AM CEST

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Associated

Rühl, Maximilian
Lehmeyer, Johannes
Nagy, Roland
Weisser, Matthias
Bockstedte, Michel
Krieger, Michael
Weber, Heiko B.
Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)

Time of origin

2021

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