Polarized Raman Microscopy to Image Microstructure Changes in Silicon Phthalocyanine Thin‐Films

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Polarized Raman Microscopy to Image Microstructure Changes in Silicon Phthalocyanine Thin‐Films ; volume:4 ; number:6 ; year:2024 ; extent:1
Small science ; 4, Heft 6 (2024) (gesamt 1)

Creator
Cranston, Rosemary R.
Lanosky, Taylor D.
Ewenike, Raluchukwu
Mckillop, Sophia
King, Benjamin
Lessard, Benoît H.

DOI
10.1002/smsc.202470017
URN
urn:nbn:de:101:1-2406141403561.246219395350
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:45 AM CEST

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Associated

  • Cranston, Rosemary R.
  • Lanosky, Taylor D.
  • Ewenike, Raluchukwu
  • Mckillop, Sophia
  • King, Benjamin
  • Lessard, Benoît H.

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