Polarized Raman Microscopy to Image Microstructure Changes in Silicon Phthalocyanine Thin‐Films
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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Polarized Raman Microscopy to Image Microstructure Changes in Silicon Phthalocyanine Thin‐Films ; volume:4 ; number:6 ; year:2024 ; extent:1
Small science ; 4, Heft 6 (2024) (gesamt 1)
- Urheber
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Cranston, Rosemary R.
Lanosky, Taylor D.
Ewenike, Raluchukwu
Mckillop, Sophia
King, Benjamin
Lessard, Benoît H.
- DOI
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10.1002/smsc.202470017
- URN
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urn:nbn:de:101:1-2406141403561.246219395350
- Rechteinformation
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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14.08.2025, 10:45 MESZ
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Beteiligte
- Cranston, Rosemary R.
- Lanosky, Taylor D.
- Ewenike, Raluchukwu
- Mckillop, Sophia
- King, Benjamin
- Lessard, Benoît H.
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