Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2150-5551
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Anmerkungen
-
online resource.
- Erschienen in
-
Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope ; volume:6 ; number:1 ; day:13 ; month:1 ; year:2014 ; pages:70-79 ; date:1.2014
Nano-Micro letters ; 6, Heft 1 (13.1.2014), 70-79, 1.2014
- Urheber
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An, Sangmin
- Beteiligte Personen und Organisationen
-
Sung, Baekman
Noh, Haneol
Stambaugh, Corey
Kwon, Soyoung
Lee, Kunyoung
Kim, Bongsu
Kim, Qhwan
Jhe, Wonho
SpringerLink (Online service)
- DOI
-
10.1007/BF03353771
- URN
-
urn:nbn:de:1111-2016052052912
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 10:44 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- An, Sangmin
- Sung, Baekman
- Noh, Haneol
- Stambaugh, Corey
- Kwon, Soyoung
- Lee, Kunyoung
- Kim, Bongsu
- Kim, Qhwan
- Jhe, Wonho
- SpringerLink (Online service)
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