Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
2150-5551
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope ; volume:6 ; number:1 ; day:13 ; month:1 ; year:2014 ; pages:70-79 ; date:1.2014
Nano-Micro letters ; 6, Heft 1 (13.1.2014), 70-79, 1.2014

Creator
An, Sangmin
Contributor
Sung, Baekman
Noh, Haneol
Stambaugh, Corey
Kwon, Soyoung
Lee, Kunyoung
Kim, Bongsu
Kim, Qhwan
Jhe, Wonho
SpringerLink (Online service)

DOI
10.1007/BF03353771
URN
urn:nbn:de:1111-2016052052912
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:44 AM CEST

Data provider

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Associated

  • An, Sangmin
  • Sung, Baekman
  • Noh, Haneol
  • Stambaugh, Corey
  • Kwon, Soyoung
  • Lee, Kunyoung
  • Kim, Bongsu
  • Kim, Qhwan
  • Jhe, Wonho
  • SpringerLink (Online service)

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