Towards reliable parameter extraction in MEMS final module testing using Bayesian inference
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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In: Sensors, 22, 14, S. 5408-
- Classification
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Elektrotechnik, Elektronik
- Event
-
Veröffentlichung
- (where)
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Augsburg
- (who)
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Universität Augsburg
- (when)
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2022
- Event
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Veröffentlichung
- (where)
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Basel
- (who)
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MDPI
- (when)
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2022
- Creator
- DOI
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10.3390/s22145408
- URN
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urn:nbn:de:bvb:384-opus4-973372
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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25.03.2025, 1:52 PM CET
Data provider
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Heringhaus, Monika E.
- Zhang, Yi
- Zimmermann, André
- Mikelsons, Lars
- Universität Augsburg
- MDPI
Time of origin
- 2022
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