Towards reliable parameter extraction in MEMS final module testing using Bayesian inference
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: Sensors, 22, 14, S. 5408-
- Klassifikation
-
Elektrotechnik, Elektronik
- Ereignis
-
Veröffentlichung
- (wo)
-
Augsburg
- (wer)
-
Universität Augsburg
- (wann)
-
2022
- Ereignis
-
Veröffentlichung
- (wo)
-
Basel
- (wer)
-
MDPI
- (wann)
-
2022
- Urheber
- DOI
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10.3390/s22145408
- URN
-
urn:nbn:de:bvb:384-opus4-973372
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:52 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Heringhaus, Monika E.
- Zhang, Yi
- Zimmermann, André
- Mikelsons, Lars
- Universität Augsburg
- MDPI
Entstanden
- 2022
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