Investigation of device related material properties of β-Ga2O3 bulk crystals and homoepitaxial layers
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
Berlin, Humboldt-Universität zu Berlin, Dissertation, 2023
- Keyword
-
Halbleiter
Silicium
Gitterbaufehler
Elektronischer Transport
Organischer Halbleiter
- Event
-
Veröffentlichung
- (where)
-
Berlin
- (who)
-
Humboldt-Universität zu Berlin
- (when)
-
2024
- Creator
- Contributor
-
Schröder, Thomas
Engel-Herbert, Roman
Krishnamoorthy, Sriram
- DOI
-
10.18452/28220
- URN
-
urn:nbn:de:kobv:11-110-18452/28927-2
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:44 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Seyidov, Palvan
- Schröder, Thomas
- Engel-Herbert, Roman
- Krishnamoorthy, Sriram
- Humboldt-Universität zu Berlin
Time of origin
- 2024
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