Sparse deep encoded features with enhanced sinogramic red deer optimization for fault inspection in wafer maps
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
1 Online-Ressource.
- Language
-
Englisch
- Bibliographic citation
-
Sparse deep encoded features with enhanced sinogramic red deer optimization for fault inspection in wafer maps ; day:20 ; month:5 ; year:2024 ; pages:1-39
Journal of intelligent manufacturing ; (20.5.2024), 1-39
- Classification
-
Elektrotechnik, Elektronik
- Creator
-
Altantawy, Doaa A.
Yakout, Mohamed A.
- Contributor
-
SpringerLink (Online service)
- DOI
-
10.1007/s10845-024-02377-4
- URN
-
urn:nbn:de:101:1-2407292117385.929250752969
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
- 14.08.2025, 10:51 AM CEST
Data provider
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Altantawy, Doaa A.
- Yakout, Mohamed A.
- SpringerLink (Online service)
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